4 Inch (100mm) Silicon Wafer – P and N Type CZ Polished and Etched Test Wafers

(1 customer review)

This is a variable product.

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SKU: vneck-tee Category:

Description

Standard 100 mm (4 inch) silicon wafers – P and N type CZ-grown wafers with tight dopant control, low contaminant levels and a large standing stock in multiple resistivities and orientations. Suitable for a wide range of process, test and research applications; custom specifications available on request.

Features

  • 4 inch (100 mm) diameter CZ silicon wafers
  • P type (boron) and N type (antimony, phosphorus) dopants
  • Resistivity range from <0.0015 to 10-20 Ohm-cm
  • 525 ± 25 um standard thickness (800 um option for PG11)
  • Etched or polished backside and surface options
  • 2 flats, TTV ≤ 5-10 um, particle control ≤ 0.3 um
  • Special specifications and new standards available on request

Typical Specifications

Control No. Type Dopant Resistivity (Ohm-cm) Thickness (um) Surface TTV (um) Flats
PG06 P Boron 1-8 525±25 Etched ≤5 2 Flats
PG07 P Boron 0.001-0.005 525±25 Etched ≤10 2 Flats
PG08 P Boron 0.01-0.02 525±25 Etched ≤10 2 Flats
PG09 P Boron 10-20 525±25 Etched ≤10 2 Flats
PG10 P Boron 1-15 525±25 Etched ≤10 2 Flats
PG11 P Boron <0.0015 800±25 Etched ≤10 2 Flats
PG12 N Antimony 0.01-0.05 525±25 Etched ≤10 2 Flats
PG13 N Antimony 0.007-0.025 525±25 Etched ≤5 2 Flats
PG14 N Phosphorus 0.001-0.005 525±25 Etched ≤5 2 Flats
PG15 N Phosphorus 1-5 525±25 Polished ≤10 2 Flats

Wafers ship in our single wafer carrier boxes and multi-wafer storage boxes – see related products below.

4 inch 100mm silicon wafer P and N type

CZ polished silicon wafer 100mm

etched test silicon wafer 4 inch

silicon wafer in single carrier box

4 inch wafer specification table

silicon wafer packaging box

wafer shipping box cover

Additional information

Color

Blue, Black

1 review for 4 Inch (100mm) Silicon Wafer – P and N Type CZ Polished and Etched Test Wafers

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